通过将专家系统与内存测试/分析仪相结合实现内存故障分析的自动化

Proceedings of Japan International Electronic Manufacturing Technology Symposium Pub Date : 1993-06-09 DOI:10.1109/IEMT.1993.639771

H. Hamada, T. Tsujide, Tosiyasu Hisii

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摘要

本文提出了一种方法，通过这种方法可以在制造之前预测记忆失效。基于这些预测和支持的历史数据，将自动创建专家规则，并与内存测试器/分析器一起使用，以确定特定内存设备故障的潜在物理原因。然后可以绘制和评估给定批次的故障原因直方图。本文给出了该方法在4mbit dram制造中的应用实例。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Automation Of Memory Failure Analysis By Combining An Expert System With A Memory Tester/analyzer

This paper presents a methodology by which predictions of memory failure are made prior to manufacturing. Based on these predictions and supporting historical data, expert rules are automatically created and used in conjunction with a memory tester/analyzer to determine the underlying physical causes of particular memory device failures. The histogram of the failure causes for a given lot can then be plotted and evaluated. Examples of the appIication of this methodology 10 the manufacture of 4 Mbit DRAMS are given.

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Proceedings of Japan International Electronic Manufacturing Technology Symposium

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