{"title":"在集成电路测试环境中有效实施统计过程控制","authors":"Sally Wilk","doi":"10.1109/TEST.1991.519705","DOIUrl":null,"url":null,"abstract":"This paper describes a Statistical Process Control (SPC) application to a WSI testec The application reviewed provides an accurate monitor of tester reliability as reported through stability, repeatability, and accuracy metrics using a calibrated external instrument. This SPC process conforms to MIL-M-38510 requirements.","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"EFFECTIVE IMPLEMENTATION OF STATISTICAL PROCESS CONTROL IN AN INTEGRATED CIRCUIT TEST ENVIRONMENT\",\"authors\":\"Sally Wilk\",\"doi\":\"10.1109/TEST.1991.519705\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes a Statistical Process Control (SPC) application to a WSI testec The application reviewed provides an accurate monitor of tester reliability as reported through stability, repeatability, and accuracy metrics using a calibrated external instrument. This SPC process conforms to MIL-M-38510 requirements.\",\"PeriodicalId\":272630,\"journal\":{\"name\":\"1991, Proceedings. International Test Conference\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-10-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1991, Proceedings. International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1991.519705\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519705","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
EFFECTIVE IMPLEMENTATION OF STATISTICAL PROCESS CONTROL IN AN INTEGRATED CIRCUIT TEST ENVIRONMENT
This paper describes a Statistical Process Control (SPC) application to a WSI testec The application reviewed provides an accurate monitor of tester reliability as reported through stability, repeatability, and accuracy metrics using a calibrated external instrument. This SPC process conforms to MIL-M-38510 requirements.
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