PTAT传感器芯片过热保护

2010 26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) Pub Date : 2010-04-08 DOI:10.1109/STHERM.2010.5444294

M. Szermer, M. Janicki, P. Pietrzak, Z. Kulesza, A. Napieralski

{"title":"PTAT传感器芯片过热保护","authors":"M. Szermer, M. Janicki, P. Pietrzak, Z. Kulesza, A. Napieralski","doi":"10.1109/STHERM.2010.5444294","DOIUrl":null,"url":null,"abstract":"This paper presents a novel application of a Proportional-To-Absolute-Temperature (PTAT) sensor. The main function of this sensor is to monitor circuit temperature and generate an overheat signal in order to warn about excessive temperature of a circuit. Special emphasis is laid on the description of the design of current mirrors, which are responsible for the output signal voltage drop when circuit temperature exceeds certain preset value. The entire design was validated by measurements of the test ASIC implementing the sensor. The measurements confirmed correct operation of the sensor, but at the same time they revealed high sensitivity of the design to the parameter spread among particular ASICs and to the interference from digital circuitry.","PeriodicalId":111882,"journal":{"name":"2010 26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-04-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"PTAT sensor for chip overheat protection\",\"authors\":\"M. Szermer, M. Janicki, P. Pietrzak, Z. Kulesza, A. Napieralski\",\"doi\":\"10.1109/STHERM.2010.5444294\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a novel application of a Proportional-To-Absolute-Temperature (PTAT) sensor. The main function of this sensor is to monitor circuit temperature and generate an overheat signal in order to warn about excessive temperature of a circuit. Special emphasis is laid on the description of the design of current mirrors, which are responsible for the output signal voltage drop when circuit temperature exceeds certain preset value. The entire design was validated by measurements of the test ASIC implementing the sensor. The measurements confirmed correct operation of the sensor, but at the same time they revealed high sensitivity of the design to the parameter spread among particular ASICs and to the interference from digital circuitry.\",\"PeriodicalId\":111882,\"journal\":{\"name\":\"2010 26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-04-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/STHERM.2010.5444294\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/STHERM.2010.5444294","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 2

摘要

本文介绍了比例绝对温度(PTAT)传感器的新应用。该传感器的主要功能是监测电路温度，并产生过热信号，以警告电路温度过高。重点介绍了当电路温度超过某一预设值时，负责输出信号电压下降的电流镜的设计。通过实现传感器的测试专用集成电路的测量验证了整个设计。测量结果证实了传感器的正确操作，但同时也揭示了该设计对特定asic之间的参数传播和数字电路干扰的高灵敏度。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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PTAT sensor for chip overheat protection

This paper presents a novel application of a Proportional-To-Absolute-Temperature (PTAT) sensor. The main function of this sensor is to monitor circuit temperature and generate an overheat signal in order to warn about excessive temperature of a circuit. Special emphasis is laid on the description of the design of current mirrors, which are responsible for the output signal voltage drop when circuit temperature exceeds certain preset value. The entire design was validated by measurements of the test ASIC implementing the sensor. The measurements confirmed correct operation of the sensor, but at the same time they revealed high sensitivity of the design to the parameter spread among particular ASICs and to the interference from digital circuitry.

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2010 26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)

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