ESD应力下多指DDSCR器件导通均匀性分析

Yang Wang, Dandan Jia, Xijun Chen, Xiangliang Jin
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引用次数: 2

摘要

本文详细研究了单指和多指传统DDSCR器件在静电放电事件下的导通均匀性。由于多指DDSCR器件结构不完全对称,各指击穿结的电场强度不同,导致冲击电离率不同。因此,设备的每个手指不能同时打开,打开的手指进入弹回区,将设备的电压拉低。如果多指设备的ESD失效电压Vt2小于触发电压Vt1,则其他手指不会导通,直到设备失效,ESD电流只能通过部分区域放电。传输线脉冲(TLP)测试结果表明,单指DDSCR器件、2指DDSCR器件和4指DDSCR器件的失效电流It2分别为6.22A、11.83A和13.33A, 4指DDSCR器件不能均匀导通。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Analysis of Turn-on Uniformity of Multi-finger DDSCR Devices under ESD Stress
This paper presents a detailed study of turn-on uniformity under electrostatic discharge events in single-finger and multi-finger traditional DDSCR devices. Since the structure of the multi-finger DDSCR device is not completely symmetrical, the electric field strength of each finger breakdown junction is different, resulting in different impact ionization rates. Therefore, each finger of device cannot be turned on at the same time, and the turned-on finger enters the snap back region and pull down the voltage of the device. If the ESD failure voltage Vt2 of the multi-finger device is less than the trigger voltage Vt1, then other fingers will not turn on until the device fails, and the ESD current can be only discharged through the partial area. The transmission line pulse (TLP) test results show that the failure currents It2 of the single-finger, 2-finger and 4-finger DDSCR devices are 6.22A, 11.83A and 13.33A, respectively, and the 4-finger device cannot be uniformly turned on.
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