{"title":"混合信号集成电路中衬底耦合精确提取和建模的有效技术","authors":"J. P. Costa, L. M. Silveira, M. Chou","doi":"10.1145/307418.307531","DOIUrl":null,"url":null,"abstract":"Accurate modeling of noise coupling effects due to crosstalk via the substrate is an increasingly important concern for the design and verification of mixed analog-digital systems. In this paper we present a technique to accelerate the model computation using BEM methods that can be used for accurate and efficient extraction of substrate coupling parameters in mixed-signal designs.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":"{\"title\":\"Efficient techniques for accurate extraction and modeling of substrate coupling in mixed-signal IC's\",\"authors\":\"J. P. Costa, L. M. Silveira, M. Chou\",\"doi\":\"10.1145/307418.307531\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Accurate modeling of noise coupling effects due to crosstalk via the substrate is an increasingly important concern for the design and verification of mixed analog-digital systems. In this paper we present a technique to accelerate the model computation using BEM methods that can be used for accurate and efficient extraction of substrate coupling parameters in mixed-signal designs.\",\"PeriodicalId\":442382,\"journal\":{\"name\":\"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"14\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/307418.307531\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/307418.307531","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Efficient techniques for accurate extraction and modeling of substrate coupling in mixed-signal IC's
Accurate modeling of noise coupling effects due to crosstalk via the substrate is an increasingly important concern for the design and verification of mixed analog-digital systems. In this paper we present a technique to accelerate the model computation using BEM methods that can be used for accurate and efficient extraction of substrate coupling parameters in mixed-signal designs.