Kunyang Liu, Gen Li, Zihan Fu, Xuanzhen Wang, H. Shinohara
{"title":"一个2.17-pJ/b 5b响应抗攻击、增强统计性能的强PUF","authors":"Kunyang Liu, Gen Li, Zihan Fu, Xuanzhen Wang, H. Shinohara","doi":"10.1109/ESSCIRC55480.2022.9911472","DOIUrl":null,"url":null,"abstract":"This article presents a Strong physically unclonable function (PUF) with a 5-bit response output, which alleviates the critical issue of huge challenge-response pair (CRP) consumption for one authentication. Attack resistance is enhanced not only by improving the substitution-permutation network (SPN) using variable secret look-up tables (LUTs) and a complex permutation XOR box but also by mitigating LUT data collision and coupling Strong PUF functions between adjacent operation rounds to protect an individual round from attack. As a result, response bitstreams pass all NIST SP800-22 randomness tests even using highly correlated challenge inputs, and mainstream modeling attacks with up to 200-Mb training samples cannot achieve higher accuracy than random guess. An automatic data write-back circuit allows the PUF to be fully stabilized by hot carrier injection (HCI) burn-in without exposing sensitive LUT data. The architecture realizes a 1-cycle/round operation and results in 2.17 pJ/b energy and 0.625 bit/cycle throughput.","PeriodicalId":168466,"journal":{"name":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-09-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A 2.17-pJ/b 5b-Response Attack-Resistant Strong PUF with Enhanced Statistical Performance\",\"authors\":\"Kunyang Liu, Gen Li, Zihan Fu, Xuanzhen Wang, H. Shinohara\",\"doi\":\"10.1109/ESSCIRC55480.2022.9911472\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This article presents a Strong physically unclonable function (PUF) with a 5-bit response output, which alleviates the critical issue of huge challenge-response pair (CRP) consumption for one authentication. Attack resistance is enhanced not only by improving the substitution-permutation network (SPN) using variable secret look-up tables (LUTs) and a complex permutation XOR box but also by mitigating LUT data collision and coupling Strong PUF functions between adjacent operation rounds to protect an individual round from attack. As a result, response bitstreams pass all NIST SP800-22 randomness tests even using highly correlated challenge inputs, and mainstream modeling attacks with up to 200-Mb training samples cannot achieve higher accuracy than random guess. An automatic data write-back circuit allows the PUF to be fully stabilized by hot carrier injection (HCI) burn-in without exposing sensitive LUT data. The architecture realizes a 1-cycle/round operation and results in 2.17 pJ/b energy and 0.625 bit/cycle throughput.\",\"PeriodicalId\":168466,\"journal\":{\"name\":\"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-09-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESSCIRC55480.2022.9911472\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSCIRC55480.2022.9911472","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 2.17-pJ/b 5b-Response Attack-Resistant Strong PUF with Enhanced Statistical Performance
This article presents a Strong physically unclonable function (PUF) with a 5-bit response output, which alleviates the critical issue of huge challenge-response pair (CRP) consumption for one authentication. Attack resistance is enhanced not only by improving the substitution-permutation network (SPN) using variable secret look-up tables (LUTs) and a complex permutation XOR box but also by mitigating LUT data collision and coupling Strong PUF functions between adjacent operation rounds to protect an individual round from attack. As a result, response bitstreams pass all NIST SP800-22 randomness tests even using highly correlated challenge inputs, and mainstream modeling attacks with up to 200-Mb training samples cannot achieve higher accuracy than random guess. An automatic data write-back circuit allows the PUF to be fully stabilized by hot carrier injection (HCI) burn-in without exposing sensitive LUT data. The architecture realizes a 1-cycle/round operation and results in 2.17 pJ/b energy and 0.625 bit/cycle throughput.