一种在千兆赫频率范围内测试tab - lsi的新技术

40th Conference Proceedings on Electronic Components and Technology Pub Date : 1990-05-20 DOI:10.1109/ECTC.1990.122303

T. Kon, S. Sasaki, R. Konno

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引用次数: 1

摘要

本文描述了一种用于工作在千兆赫频率范围内的TAB(磁带自动粘合)lsi的新型测试技术。一个标签带夹在测试工具之间，以便在测试期间组成带状线配置。该技术通过降低由测试引线和测试集之间的阻抗不匹配引起的反射噪声，可以显着扩展测试频率范围。最大测试比特率达到5gb /s，是传统技术的2.5倍。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A new technique for testing TAB-LSIs in gigahertz frequency range

A novel testing technique for TAB (tape-automated-bonding) LSIs operating in the gigahertz-frequency range is described. A TAB tape is sandwiched between test tools in order to compose a stripline configuration during testing. This technique allows the testing frequency range to be dramatically extended by reducing reflection noise caused by impedance mismatch between the test leads and the test sets. Maximum testing bit rate reaches 5 Gb/s, which is 2.5 times greater than that of the conventional technique.<>

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来源期刊

40th Conference Proceedings on Electronic Components and Technology

CiteScore

3.10

自引率

0.00%

发文量