{"title":"σ - δ变换器对电磁干扰的敏感性","authors":"Domenico Musumeci, F. Fiori","doi":"10.1109/EMCZUR.2009.4783466","DOIUrl":null,"url":null,"abstract":"This paper discusses the susceptibility of Sigma-Delta Analog-to-Digital converters to disturbances, arising from environmental electromagnetic pollution or from the parasitic coupling with noisy building blocks integrated in the same system-on-chip (SoC) or system-in-package (SiP). The operation of a first-order switched-capacitor sigma-delta converter, which receives at its input nominal signals corrupted by radio-frequency interference is analyzed through time domain computer simulations and the root causes of failures are discussed in detail.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Susceptibility of a Sigma-Delta Converter to EMI\",\"authors\":\"Domenico Musumeci, F. Fiori\",\"doi\":\"10.1109/EMCZUR.2009.4783466\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper discusses the susceptibility of Sigma-Delta Analog-to-Digital converters to disturbances, arising from environmental electromagnetic pollution or from the parasitic coupling with noisy building blocks integrated in the same system-on-chip (SoC) or system-in-package (SiP). The operation of a first-order switched-capacitor sigma-delta converter, which receives at its input nominal signals corrupted by radio-frequency interference is analyzed through time domain computer simulations and the root causes of failures are discussed in detail.\",\"PeriodicalId\":192851,\"journal\":{\"name\":\"2009 20th International Zurich Symposium on Electromagnetic Compatibility\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-02-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 20th International Zurich Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCZUR.2009.4783466\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCZUR.2009.4783466","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper discusses the susceptibility of Sigma-Delta Analog-to-Digital converters to disturbances, arising from environmental electromagnetic pollution or from the parasitic coupling with noisy building blocks integrated in the same system-on-chip (SoC) or system-in-package (SiP). The operation of a first-order switched-capacitor sigma-delta converter, which receives at its input nominal signals corrupted by radio-frequency interference is analyzed through time domain computer simulations and the root causes of failures are discussed in detail.
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