易于测试的多值蜂窝阵列

[1992] Proceedings The Twenty-Second International Symposium on Multiple-Valued Logic Pub Date : 1992-05-27 DOI:10.1109/ISMVL.1992.186775

N. Kamiura, Y. Hata, F. Miyawaki, K. Yamato

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引用次数: 7

摘要

提出了一种易于测试的由输入阵列和控制阵列组成的k值元胞阵列，该阵列比其他方法需要更少的单元。在假定数组中发生单个故障的情况下处理卡滞、打开和and桥接故障。测试输入向量可以很容易地从指定单元开关的控制输入生成。结果表明，利用多个可观测终端和(k+1)值逻辑值可以有效地诊断出故障单元。

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Easily testable multiple-valued cellular arrays

An easily testable k-valued cellular array consisting of input arrays and a control array that requires fewer cells than other methods is proposed. Stuck-at, open, and AND bridging faults are treated under the assumption that a single fault occurs in the array. Test input vectors can be easily generated from control inputs that specify the switches of cells. It is shown that a faulty cell can be effectively diagnosed by using several observable terminals and (k+1)-valued logic values.<>

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[1992] Proceedings The Twenty-Second International Symposium on Multiple-Valued Logic

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