利用巴特勒矩阵测量宽带反射系数

2013 SBMO/IEEE MTT-S International Microwave & Optoelectronics Conference (IMOC) Pub Date : 2013-10-28 DOI:10.1109/IMOC.2013.6646410

K. Staszek, S. Gruszczynski, K. Wincza, A. Rydosz

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引用次数: 4

摘要

提出了一种4 × 4巴特勒矩阵在宽带反射计中的新应用。众所周知的专用多端口已被标准的4 × 4巴特勒矩阵所取代，反射元件连接到其中一个端口。结果表明，该网络的性质允许复杂反射系数的测量。为了扩大测量频率范围，对校准程序进行了简单的修改。通过对3个频率为1 ~ 5ghz的短衰减器的反射系数测量，验证了该系统的有效性。将测量结果与商用VNA进行了比较，结果吻合较好。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Broadband measurements of reflection coefficient with the use of Butler matrix

A novel application of a 4 × 4 Butler matrix in a broadband reflectometer is presented. The well-known dedicated multiport has been replaced with a standard 4 × 4 Butler matrix with reflective element connected to the one of its ports. It is shown, that properties of such a network allow for the complex reflection coefficient measurements. In order to broaden measurement frequency range, a simple modification of a calibration procedure is proposed. The presented system has been verified experimentally by the measurement of reflection coefficients of three shorted attenuators in frequency range 1 - 5 GHz. The measurements have been compared with ones obtained with the use of commercial VNA, showing good agreement.

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2013 SBMO/IEEE MTT-S International Microwave & Optoelectronics Conference (IMOC)

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