{"title":"一种适用于输电在线测量的新型去嵌入方法","authors":"Bichen Chen, X. Ye, Bill Samaras, J. Fan","doi":"10.1109/APEMC.2015.7175313","DOIUrl":null,"url":null,"abstract":"A novel de-embedding method on transmission line device under testing (DUT) is introduced in this paper. The technique can be used as an alternative to classic calibration approaches, such as SOLT, TRL, LRM, or LRRM whenever the de-embedded structure is a transmission line. The method only requires two measurement patterns: a true through as test fixture and a total pattern with targeting DUT embedded in. With a quasi-symmetry requirement in test fixtures, it is also a good substitute for newly released two-pattern de-embedding methodologies which have rigid symmetric demanding in text fixtures design and manufactures.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"191 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"32","resultStr":"{\"title\":\"A novel de-embedding method suitable for transmission-line measurement\",\"authors\":\"Bichen Chen, X. Ye, Bill Samaras, J. Fan\",\"doi\":\"10.1109/APEMC.2015.7175313\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel de-embedding method on transmission line device under testing (DUT) is introduced in this paper. The technique can be used as an alternative to classic calibration approaches, such as SOLT, TRL, LRM, or LRRM whenever the de-embedded structure is a transmission line. The method only requires two measurement patterns: a true through as test fixture and a total pattern with targeting DUT embedded in. With a quasi-symmetry requirement in test fixtures, it is also a good substitute for newly released two-pattern de-embedding methodologies which have rigid symmetric demanding in text fixtures design and manufactures.\",\"PeriodicalId\":325138,\"journal\":{\"name\":\"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)\",\"volume\":\"191 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-05-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"32\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APEMC.2015.7175313\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEMC.2015.7175313","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A novel de-embedding method suitable for transmission-line measurement
A novel de-embedding method on transmission line device under testing (DUT) is introduced in this paper. The technique can be used as an alternative to classic calibration approaches, such as SOLT, TRL, LRM, or LRRM whenever the de-embedded structure is a transmission line. The method only requires two measurement patterns: a true through as test fixture and a total pattern with targeting DUT embedded in. With a quasi-symmetry requirement in test fixtures, it is also a good substitute for newly released two-pattern de-embedding methodologies which have rigid symmetric demanding in text fixtures design and manufactures.