{"title":"网络化嵌入式系统的功能验证","authors":"N. Bombieri, F. Fummi, G. Pravadelli","doi":"10.1109/ISQED.2005.59","DOIUrl":null,"url":null,"abstract":"We propose an automatic mechanism to extract the environment of a networked embedded system (NEV), and a functional verification methodology, which mixes automatic test pattern generation and model checking, exploiting the network environment constraints.","PeriodicalId":333840,"journal":{"name":"Sixth international symposium on quality electronic design (isqed'05)","volume":"141 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Functional verification of networked embedded systems\",\"authors\":\"N. Bombieri, F. Fummi, G. Pravadelli\",\"doi\":\"10.1109/ISQED.2005.59\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We propose an automatic mechanism to extract the environment of a networked embedded system (NEV), and a functional verification methodology, which mixes automatic test pattern generation and model checking, exploiting the network environment constraints.\",\"PeriodicalId\":333840,\"journal\":{\"name\":\"Sixth international symposium on quality electronic design (isqed'05)\",\"volume\":\"141 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-03-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Sixth international symposium on quality electronic design (isqed'05)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISQED.2005.59\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Sixth international symposium on quality electronic design (isqed'05)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2005.59","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Functional verification of networked embedded systems
We propose an automatic mechanism to extract the environment of a networked embedded system (NEV), and a functional verification methodology, which mixes automatic test pattern generation and model checking, exploiting the network environment constraints.