镧(X)离子含量对X/65/35 PLZT陶瓷压电性能的影响

M. Płońska, Z. Surowiak
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引用次数: 12

摘要

多年来,PLZT陶瓷一直被认为是一种具有各种电光和压电特性的铁电材料。本工作的目的是研究镧掺杂剂(x)对x/65/35 PLZT陶瓷压电性能的影响。所有样品均采用热单轴挤压法烧结,由溶胶-凝胶衍生粉末制成。测量包含电参数的复合体,如:e、tgδ、kp、k31、d31、s11e;g 31, V R。在日立S-4700 FESEM上对未极化和极化样品的畴结构进行了分析。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Piezoelectric Properties of X/65/35 PLZT Ceramics Depended of the Lanthanum (X) Ions Contents
For many years the PLZT ceramics have been known as a ferroelectric material which has various electro-optic and piezoelectric properties. The aim of this work was to study how the lanthanum dopant (x) influences on the piezoelectric properties of x/65/35 PLZT ceramics. All samples were sintered by the hot uniaxial pressing method, from the sol-gel derived powders. The measurements enclose the complex of electric parameters, such as: e, tgδ, k p , k 31 , d 31 , S 11 E ; g 31 , V R . The domain structures of unpoled and poled samples were conducted on the FESEM HITACHI S-4700.
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