{"title":"具有减少瞬态误差电荷的MOS通型晶体管","authors":"J. Kuo, C. Fu, D. Dameron, R. Dutton, B. Wooley","doi":"10.1109/ISSCC.1986.1157005","DOIUrl":null,"url":null,"abstract":"A two-lump model, developed for MOS pass transistors, to represent the turnoff transient error charge, will be described. Reduction of this error by 90% will be cited for a circular transistor structure.","PeriodicalId":440688,"journal":{"name":"1986 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"MOS pass transistors with reduced transient error charge\",\"authors\":\"J. Kuo, C. Fu, D. Dameron, R. Dutton, B. Wooley\",\"doi\":\"10.1109/ISSCC.1986.1157005\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A two-lump model, developed for MOS pass transistors, to represent the turnoff transient error charge, will be described. Reduction of this error by 90% will be cited for a circular transistor structure.\",\"PeriodicalId\":440688,\"journal\":{\"name\":\"1986 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1986 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.1986.1157005\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1986 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1986.1157005","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
MOS pass transistors with reduced transient error charge
A two-lump model, developed for MOS pass transistors, to represent the turnoff transient error charge, will be described. Reduction of this error by 90% will be cited for a circular transistor structure.