检测还是纠正?

A. Bramnik, Yiannakis Sazeides
{"title":"检测还是纠正?","authors":"A. Bramnik, Yiannakis Sazeides","doi":"10.1109/IOLTS.2018.8474073","DOIUrl":null,"url":null,"abstract":"This paper reviews state of art techniques used to protect memory arrays in processors against errors. We discuss the strength and weakness of various techniques and explain how to lessen some of their limitations. We also perform a comparative analysis of the various techniques in the presence of multi cell upsets. This study reveals that there are situations where a less costly only detection code may be advantageous over a more expensive code that can detect and correct errors. This indicates that correction vs detection trade-offs need to be revisited in the presence of multi cell upsets.","PeriodicalId":241735,"journal":{"name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"To Detect or to Correct?\",\"authors\":\"A. Bramnik, Yiannakis Sazeides\",\"doi\":\"10.1109/IOLTS.2018.8474073\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper reviews state of art techniques used to protect memory arrays in processors against errors. We discuss the strength and weakness of various techniques and explain how to lessen some of their limitations. We also perform a comparative analysis of the various techniques in the presence of multi cell upsets. This study reveals that there are situations where a less costly only detection code may be advantageous over a more expensive code that can detect and correct errors. This indicates that correction vs detection trade-offs need to be revisited in the presence of multi cell upsets.\",\"PeriodicalId\":241735,\"journal\":{\"name\":\"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)\",\"volume\":\"19 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IOLTS.2018.8474073\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS.2018.8474073","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文回顾了用于保护处理器中的存储器阵列免受错误影响的最新技术。我们将讨论各种技术的优缺点,并解释如何减少它们的一些局限性。我们还进行了比较分析的各种技术,在多细胞扰乱的存在。这项研究表明,在某些情况下,成本较低的仅检测代码可能比可以检测和纠正错误的成本较高的代码更有优势。这表明,在存在多细胞扰动的情况下,需要重新考虑校正与检测的权衡。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
To Detect or to Correct?
This paper reviews state of art techniques used to protect memory arrays in processors against errors. We discuss the strength and weakness of various techniques and explain how to lessen some of their limitations. We also perform a comparative analysis of the various techniques in the presence of multi cell upsets. This study reveals that there are situations where a less costly only detection code may be advantageous over a more expensive code that can detect and correct errors. This indicates that correction vs detection trade-offs need to be revisited in the presence of multi cell upsets.
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