论电容式探头测得的电荷密度

Z. Fang
{"title":"论电容式探头测得的电荷密度","authors":"Z. Fang","doi":"10.1109/ISE.1996.578074","DOIUrl":null,"url":null,"abstract":"In investigation on behaviour of excess charge on an electric insulator, a capacitive probe is usually used to detect this charge. The relation between response of the probe and the excess charge density varies with the shape of the insulator. For very thin film, the record of the probe is 1//spl epsiv//sub r/ times of the excess charge density; and 2/spl epsiv//sub 0//(/spl epsiv//sub 0/+/spl epsiv//sub 1/) times of the excess charge density for thick slab. In the case of right cylindrical spacer, the response of the probe is equal to the excess charge density when its distribution on the circumference is uniform.","PeriodicalId":425004,"journal":{"name":"9th International Symposium on Electrets (ISE 9) Proceedings","volume":"69 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"On the charge density measured by the capacitive probe\",\"authors\":\"Z. Fang\",\"doi\":\"10.1109/ISE.1996.578074\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In investigation on behaviour of excess charge on an electric insulator, a capacitive probe is usually used to detect this charge. The relation between response of the probe and the excess charge density varies with the shape of the insulator. For very thin film, the record of the probe is 1//spl epsiv//sub r/ times of the excess charge density; and 2/spl epsiv//sub 0//(/spl epsiv//sub 0/+/spl epsiv//sub 1/) times of the excess charge density for thick slab. In the case of right cylindrical spacer, the response of the probe is equal to the excess charge density when its distribution on the circumference is uniform.\",\"PeriodicalId\":425004,\"journal\":{\"name\":\"9th International Symposium on Electrets (ISE 9) Proceedings\",\"volume\":\"69 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-09-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"9th International Symposium on Electrets (ISE 9) Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISE.1996.578074\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"9th International Symposium on Electrets (ISE 9) Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISE.1996.578074","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

在研究电绝缘体上多余电荷的行为时,通常使用电容探头来检测多余电荷。探针的响应与多余电荷密度的关系随绝缘子形状的不同而不同。对于非常薄的薄膜,探针的记录为1// sp1 / epsiv// subr /乘以多余电荷密度;2/spl epsiv//sub 0//(/spl epsiv//sub 0/+/spl epsiv//sub 1/)倍于厚板的多余电荷密度。对于右圆柱形间隔片,当其在圆周上均匀分布时,探头的响应等于过量电荷密度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
On the charge density measured by the capacitive probe
In investigation on behaviour of excess charge on an electric insulator, a capacitive probe is usually used to detect this charge. The relation between response of the probe and the excess charge density varies with the shape of the insulator. For very thin film, the record of the probe is 1//spl epsiv//sub r/ times of the excess charge density; and 2/spl epsiv//sub 0//(/spl epsiv//sub 0/+/spl epsiv//sub 1/) times of the excess charge density for thick slab. In the case of right cylindrical spacer, the response of the probe is equal to the excess charge density when its distribution on the circumference is uniform.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信