Hiroki Yamazawa, Kazuki Maeda, Tomoko Ogura Iwasaki, K. Takeuchi
{"title":"具有精密ECC和粉碎技术的隐私保护SSD,用于15.5倍改进的数据寿命控制","authors":"Hiroki Yamazawa, Kazuki Maeda, Tomoko Ogura Iwasaki, K. Takeuchi","doi":"10.1109/IMW.2016.7495286","DOIUrl":null,"url":null,"abstract":"The privacy-protection solid-state storage (PP-SSS) system is a proposal for Internet-data's \"right to be forgotten\", in which data-lifetimes are specified without file-system overhead. In NAND flash memory, the data-lifetimes are controlled by intentionally injecting errors into the data during write, to accelerate retention failure. However, the previously reported PP-SSS [1] has 2 issues, wide variation of data-lifetime and limited effectiveness for uncompressed data. In this work, based on 1Xnm TLC NAND flash measurement, 2 improvement techniques are demonstrated. Precision ECC increases the ECC codeword length and crush judges when the data expires and converts it to black/ irrecoverable data. When precision ECC and crush are applied to conventional PP-SSS, data-lifetime variation decreases by 15.5×, from 31 days to 2 days, and both compressed and uncompressed data can be protected.","PeriodicalId":365759,"journal":{"name":"2016 IEEE 8th International Memory Workshop (IMW)","volume":"54 6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Privacy-Protection SSD with Precision ECC and Crush Techniques for 15.5× Improved Data-Lifetime Control\",\"authors\":\"Hiroki Yamazawa, Kazuki Maeda, Tomoko Ogura Iwasaki, K. Takeuchi\",\"doi\":\"10.1109/IMW.2016.7495286\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The privacy-protection solid-state storage (PP-SSS) system is a proposal for Internet-data's \\\"right to be forgotten\\\", in which data-lifetimes are specified without file-system overhead. In NAND flash memory, the data-lifetimes are controlled by intentionally injecting errors into the data during write, to accelerate retention failure. However, the previously reported PP-SSS [1] has 2 issues, wide variation of data-lifetime and limited effectiveness for uncompressed data. In this work, based on 1Xnm TLC NAND flash measurement, 2 improvement techniques are demonstrated. Precision ECC increases the ECC codeword length and crush judges when the data expires and converts it to black/ irrecoverable data. When precision ECC and crush are applied to conventional PP-SSS, data-lifetime variation decreases by 15.5×, from 31 days to 2 days, and both compressed and uncompressed data can be protected.\",\"PeriodicalId\":365759,\"journal\":{\"name\":\"2016 IEEE 8th International Memory Workshop (IMW)\",\"volume\":\"54 6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-05-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 8th International Memory Workshop (IMW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMW.2016.7495286\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 8th International Memory Workshop (IMW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMW.2016.7495286","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Privacy-Protection SSD with Precision ECC and Crush Techniques for 15.5× Improved Data-Lifetime Control
The privacy-protection solid-state storage (PP-SSS) system is a proposal for Internet-data's "right to be forgotten", in which data-lifetimes are specified without file-system overhead. In NAND flash memory, the data-lifetimes are controlled by intentionally injecting errors into the data during write, to accelerate retention failure. However, the previously reported PP-SSS [1] has 2 issues, wide variation of data-lifetime and limited effectiveness for uncompressed data. In this work, based on 1Xnm TLC NAND flash measurement, 2 improvement techniques are demonstrated. Precision ECC increases the ECC codeword length and crush judges when the data expires and converts it to black/ irrecoverable data. When precision ECC and crush are applied to conventional PP-SSS, data-lifetime variation decreases by 15.5×, from 31 days to 2 days, and both compressed and uncompressed data can be protected.