基于特征值约简问题的s参数间接测量方法

2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) Pub Date : 2017-10-01 DOI:10.1109/EPEPS.2017.8329755

N. Maeda, S. Fukui, T. Sekine, Yasuhiro Takahashi

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引用次数: 6

摘要

提出了一种新的多端口电路s参数的测量方法，其中一些端口不能直接测量。我们通过将它简化为特征值问题来解决这个问题。本文将该方法推广到直接测量端口数超过间接测量端口数的电路中。算例表明了该方法的有效性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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An indirect measurement method for S-parameters which is based on reduction to eigenvalue problem

A novel measurement method for the S-parameters of multiport circuit with some of its ports not directly measured is proposed. We solve this problem by reducing it to an eigenvalue problem. In this paper, the method has been extended to circuits where the number of direct-measured ports exceeds that of indirect-measured ports. A numerical example shows its validity.

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来源期刊

2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)

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