动态CMOS电路中衬底噪声效应的建模

S.R. Gosavi, W. Al-Assadi, S. Burugapalli
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引用次数: 2

摘要

特征尺寸的减小导致了数字和模拟电路在同一硅片上的集成,从而导致了许多串扰问题。由于衬底相互作用而产生的串扰也抄袭了完整的数字系统。由于动态CMOS电路易受噪声的影响,本文着重讨论了这一问题;本文简要研究了衬底变化对动态CMOS电路性能的影响。本文还描述了基片噪声在甚高频(10ghz以上)下的影响。为了准确估计衬底噪声的影响,本文最后一节提出了衬底模型并验证了其功能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Modeling of Substrate Noise Effects in Dynamic CMOS Circuits
The decrease in the feature size has led to the integration of both digital and analog circuits on the same silicon die which has led to many crosstalk issues. The crosstalk due to the substrate interactions also plagiarizes complete digital systems. This paper lays emphasis on this fact and because of the vulnerability of dynamic CMOS circuits to noise; a brief study of the effects of substrate variations on the performance of the dynamic CMOS circuits is carried out in this paper. The effects of substrate noise at very high frequencies (above 10 GHz) are also depicted in this paper. In order to accurately estimate the effects of substrate noise a substrate model is proposed and verified for functionality in the last section of this paper.
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