FPGA实现电路的单故障可靠性分析

H. Jahanirad, K. Mohammadi, Pejman Attarsharghi
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引用次数: 4

摘要

FPGA实现逻辑电路的可靠性分析是设计故障环境下容错系统的一个重要问题。本文提出了一种分析这类系统的解析方法。该方法基于故障从外观位置到电路最终输出的信号概率传播。对于路由和lut中发生的故障,采用单故障模型。此外,采用16相关系数传播方法处理再收敛扇出。实验结果表明,该方法与蒙特卡罗方法在MCNC基准可靠性分析中的一致性较好。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Single fault reliability analysis in FPGA implemented circuits
Reliability analysis in FPGA implementation of logic circuits is an important issue in designing fault tolerant systems for faulty environments. In this paper an analytical method is developed for analyzing such systems. This method is based on signal probability propagation of faults from the location of appearance to final outputs of circuit. Single fault model is used for the faults occurred in routes and LUTs. In addition reconvergent fan-outs are handled using 16 correlation coefficients propagation approach. Experimental results show a good agreement between this method and Monte Carlo method for reliability analysis of MCNC benchmarks.
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