{"title":"3 GHz以下S参数测量S/390 MCM封装的电气特性","authors":"F. Ktata, U. Arz, H. Grabinski","doi":"10.1109/EPEP.1999.819197","DOIUrl":null,"url":null,"abstract":"In this work, we investigate the electrical performance of critical signal paths in IBM S/390 MCM packages. We present lumped RLC-models suitable for standard circuit simulators operating in the time domain, e.g. SPICE. The models are developed from finite element simulations of typical signal path segments. By comparing S-parameters from simulations of the models to two-port network analyzer measurements, we validate the models in a frequency range up to 3 GHz.","PeriodicalId":299335,"journal":{"name":"IEEE 8th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No.99TH8412)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-10-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Electrical characterization of S/390 MCM packages from S-parameter measurements below 3 GHz\",\"authors\":\"F. Ktata, U. Arz, H. Grabinski\",\"doi\":\"10.1109/EPEP.1999.819197\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work, we investigate the electrical performance of critical signal paths in IBM S/390 MCM packages. We present lumped RLC-models suitable for standard circuit simulators operating in the time domain, e.g. SPICE. The models are developed from finite element simulations of typical signal path segments. By comparing S-parameters from simulations of the models to two-port network analyzer measurements, we validate the models in a frequency range up to 3 GHz.\",\"PeriodicalId\":299335,\"journal\":{\"name\":\"IEEE 8th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No.99TH8412)\",\"volume\":\"29 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-10-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE 8th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No.99TH8412)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEP.1999.819197\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 8th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No.99TH8412)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.1999.819197","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Electrical characterization of S/390 MCM packages from S-parameter measurements below 3 GHz
In this work, we investigate the electrical performance of critical signal paths in IBM S/390 MCM packages. We present lumped RLC-models suitable for standard circuit simulators operating in the time domain, e.g. SPICE. The models are developed from finite element simulations of typical signal path segments. By comparing S-parameters from simulations of the models to two-port network analyzer measurements, we validate the models in a frequency range up to 3 GHz.