T. Amaral, V. Pires, A. Pires, J. Martins, Hao Chen
{"title":"基于对称指标的SRM驱动功率晶体管故障诊断","authors":"T. Amaral, V. Pires, A. Pires, J. Martins, Hao Chen","doi":"10.1109/BEC.2018.8600966","DOIUrl":null,"url":null,"abstract":"To reduce the negative impacts of power converters on a machine such as switched reluctance motor (SRM) a fast and accurate fault detection method is required. Several fault types could occur in SRM drives, such as, open and short-circuit transistor faults. Thus, this paper presents a new fault detection and diagnosis method for transistor faults in a SRM drive. The method is based on symmetry indexes that are created from the analysis of the currents patterns. The proposed approach results in a fast and robust method, presenting immunity to different mechanical conditions. The characteristics of the proposed method will be verified through several simulation tests.","PeriodicalId":140384,"journal":{"name":"2018 16th Biennial Baltic Electronics Conference (BEC)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Power Transistor Fault Diagnosis in SRM Drives Based on Indexes of Symmetry\",\"authors\":\"T. Amaral, V. Pires, A. Pires, J. Martins, Hao Chen\",\"doi\":\"10.1109/BEC.2018.8600966\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"To reduce the negative impacts of power converters on a machine such as switched reluctance motor (SRM) a fast and accurate fault detection method is required. Several fault types could occur in SRM drives, such as, open and short-circuit transistor faults. Thus, this paper presents a new fault detection and diagnosis method for transistor faults in a SRM drive. The method is based on symmetry indexes that are created from the analysis of the currents patterns. The proposed approach results in a fast and robust method, presenting immunity to different mechanical conditions. The characteristics of the proposed method will be verified through several simulation tests.\",\"PeriodicalId\":140384,\"journal\":{\"name\":\"2018 16th Biennial Baltic Electronics Conference (BEC)\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 16th Biennial Baltic Electronics Conference (BEC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/BEC.2018.8600966\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 16th Biennial Baltic Electronics Conference (BEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BEC.2018.8600966","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Power Transistor Fault Diagnosis in SRM Drives Based on Indexes of Symmetry
To reduce the negative impacts of power converters on a machine such as switched reluctance motor (SRM) a fast and accurate fault detection method is required. Several fault types could occur in SRM drives, such as, open and short-circuit transistor faults. Thus, this paper presents a new fault detection and diagnosis method for transistor faults in a SRM drive. The method is based on symmetry indexes that are created from the analysis of the currents patterns. The proposed approach results in a fast and robust method, presenting immunity to different mechanical conditions. The characteristics of the proposed method will be verified through several simulation tests.