{"title":"利用多维配置热电的3d - ic主动冷却方法的实验分析模型","authors":"Huy N. Q. Phan, D. Agonafer","doi":"10.1109/STHERM.2010.5444315","DOIUrl":null,"url":null,"abstract":"Presently, stack-dice are used widely as low-power memory applications because thermal management of such 3D architecture as high-power processors inherits many thermal challenges. Inadequate thermal management of 3D-ICs leads to reduction in performance, reliability, and ultimately system catastrophic failure. Heat dissipation of 3D systems is highly non-uniform and non-unidirectional due to many factors such as power architectures, transistors packing density, and real estate available on the chip and on the motherboard. In this study, the development of an experimental model of an active cooling method to cool a 0.4 W/mm2 stack-dice to 13°C utilizing a multi-dimensional configured thermoelectric will be presented.","PeriodicalId":111882,"journal":{"name":"2010 26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-04-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Experimental analysis model of an active cooling method for 3D-ICs utilizing a multidimensional configured thermoelectric\",\"authors\":\"Huy N. Q. Phan, D. Agonafer\",\"doi\":\"10.1109/STHERM.2010.5444315\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Presently, stack-dice are used widely as low-power memory applications because thermal management of such 3D architecture as high-power processors inherits many thermal challenges. Inadequate thermal management of 3D-ICs leads to reduction in performance, reliability, and ultimately system catastrophic failure. Heat dissipation of 3D systems is highly non-uniform and non-unidirectional due to many factors such as power architectures, transistors packing density, and real estate available on the chip and on the motherboard. In this study, the development of an experimental model of an active cooling method to cool a 0.4 W/mm2 stack-dice to 13°C utilizing a multi-dimensional configured thermoelectric will be presented.\",\"PeriodicalId\":111882,\"journal\":{\"name\":\"2010 26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-04-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/STHERM.2010.5444315\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 26th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/STHERM.2010.5444315","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Experimental analysis model of an active cooling method for 3D-ICs utilizing a multidimensional configured thermoelectric
Presently, stack-dice are used widely as low-power memory applications because thermal management of such 3D architecture as high-power processors inherits many thermal challenges. Inadequate thermal management of 3D-ICs leads to reduction in performance, reliability, and ultimately system catastrophic failure. Heat dissipation of 3D systems is highly non-uniform and non-unidirectional due to many factors such as power architectures, transistors packing density, and real estate available on the chip and on the motherboard. In this study, the development of an experimental model of an active cooling method to cool a 0.4 W/mm2 stack-dice to 13°C utilizing a multi-dimensional configured thermoelectric will be presented.