M. Deng, S. Lépilliet, F. Danneville, G. Dambrine, D. Gloria, T. Quemerais, P. Chevalier
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Uncertainties assessment of noise parameters in D- band using in situ tuner techniques
When transistor noise characterization becomes a difficult task at millimeter wave range, the accuracy on the resulting noise parameters is not or poorly discussed. Within this context, this paper aims to present a methodology to estimate the uncertainties related to the extraction of the four noise parameters when using in situ tuner techniques, in the 130-170 GHz frequency range. B9MW SiGe HBT from STMicroelectonics was used as a test vehicle for the noise characterization and uncertainties assessment.
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