高频全差分CMOS ota测试板设计与测量技术

Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334) Pub Date : 1997-09-07 DOI:10.1109/ASIC.1997.617030

D. Hsiu-Chun Chiang, R. Schaumann, W. R. Daasch

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引用次数: 1

摘要

实验程序和一个通用的电路板设计用于测试全差分CMOS ota。该技术可用于测量OTA的大多数直流和交流参数。所使用的方法为OTA设计提供了指导方针。

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Test board design and measurement techniques for high-frequency fully-differential CMOS OTAs

Experimental procedures and a versatile circuit board designed for testing fully-differential CMOS OTAs are presented. The techniques can be used to measure most DC and AC parameters of an OTA. The approach used leads to guidelines for OTA design.

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来源期刊

Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334)

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