{"title":"微波晶体管噪声参数提取精度的提高","authors":"G. Vasilescu, G. Alquié","doi":"10.1109/SMICND.1997.651186","DOIUrl":null,"url":null,"abstract":"This paper presents the influence of the choice of source admittances on the accuracy of noise parameters extraction, when using the noise parameter extraction method proposed by Vasilescu. The results obtained for three different microwave transistors are presented. The best and the worst distributions are put into evidence.","PeriodicalId":144314,"journal":{"name":"1997 International Semiconductor Conference 20th Edition. CAS '97 Proceedings","volume":"111 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Accuracy improvements in microwave transistor noise parameters extraction\",\"authors\":\"G. Vasilescu, G. Alquié\",\"doi\":\"10.1109/SMICND.1997.651186\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents the influence of the choice of source admittances on the accuracy of noise parameters extraction, when using the noise parameter extraction method proposed by Vasilescu. The results obtained for three different microwave transistors are presented. The best and the worst distributions are put into evidence.\",\"PeriodicalId\":144314,\"journal\":{\"name\":\"1997 International Semiconductor Conference 20th Edition. CAS '97 Proceedings\",\"volume\":\"111 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-10-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1997 International Semiconductor Conference 20th Edition. CAS '97 Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SMICND.1997.651186\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1997 International Semiconductor Conference 20th Edition. CAS '97 Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMICND.1997.651186","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Accuracy improvements in microwave transistor noise parameters extraction
This paper presents the influence of the choice of source admittances on the accuracy of noise parameters extraction, when using the noise parameter extraction method proposed by Vasilescu. The results obtained for three different microwave transistors are presented. The best and the worst distributions are put into evidence.
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