{"title":"焊料棒——用于大功率器件的新型倒装芯片","authors":"P. Elenius, H. Yang, R. Benson","doi":"10.1109/ECTC.2000.853234","DOIUrl":null,"url":null,"abstract":"The compatibility of conventional flip chip technology for high power/high current applications can present functional and reliability issues during the device operating life. Typical flip chip solder bumps can experience early failures due to electromigration when exposed to a high current density at a given junction temperature. As a viable alternative, the solder bar approach was developed to increase the cross-sectional area of the solder joint, there by reducing current density and improving device operating life.","PeriodicalId":410140,"journal":{"name":"2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070)","volume":"43 7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Solder bars-a novel flip chip application for high power devices\",\"authors\":\"P. Elenius, H. Yang, R. Benson\",\"doi\":\"10.1109/ECTC.2000.853234\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The compatibility of conventional flip chip technology for high power/high current applications can present functional and reliability issues during the device operating life. Typical flip chip solder bumps can experience early failures due to electromigration when exposed to a high current density at a given junction temperature. As a viable alternative, the solder bar approach was developed to increase the cross-sectional area of the solder joint, there by reducing current density and improving device operating life.\",\"PeriodicalId\":410140,\"journal\":{\"name\":\"2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070)\",\"volume\":\"43 7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-05-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTC.2000.853234\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.2000.853234","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Solder bars-a novel flip chip application for high power devices
The compatibility of conventional flip chip technology for high power/high current applications can present functional and reliability issues during the device operating life. Typical flip chip solder bumps can experience early failures due to electromigration when exposed to a high current density at a given junction temperature. As a viable alternative, the solder bar approach was developed to increase the cross-sectional area of the solder joint, there by reducing current density and improving device operating life.