描述亚稳度

Proceedings Second International Symposium on Advanced Research in Asynchronous Circuits and Systems Pub Date : 1900-01-01 DOI:10.1109/ASYNC.1996.494449

C. Foley

{"title":"描述亚稳度","authors":"C. Foley","doi":"10.1109/ASYNC.1996.494449","DOIUrl":null,"url":null,"abstract":"Determining metastability characteristics is challenging. Devising reliable and repeatable experiments and procedures requires time, patience, care and knowledge. This discussion presents practical measurement techniques to accurately determine the Resolving Time Constant (/spl tau/) and Metastability Window (W). Also included is a method for observing the metastability failure rate at a designated time following the clock. By converting this failure rate to observed MTBF (Mean Time Between Failure), a comparison is made to a predicted MTBF.","PeriodicalId":365358,"journal":{"name":"Proceedings Second International Symposium on Advanced Research in Asynchronous Circuits and Systems","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"36","resultStr":"{\"title\":\"Characterizing metastability\",\"authors\":\"C. Foley\",\"doi\":\"10.1109/ASYNC.1996.494449\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Determining metastability characteristics is challenging. Devising reliable and repeatable experiments and procedures requires time, patience, care and knowledge. This discussion presents practical measurement techniques to accurately determine the Resolving Time Constant (/spl tau/) and Metastability Window (W). Also included is a method for observing the metastability failure rate at a designated time following the clock. By converting this failure rate to observed MTBF (Mean Time Between Failure), a comparison is made to a predicted MTBF.\",\"PeriodicalId\":365358,\"journal\":{\"name\":\"Proceedings Second International Symposium on Advanced Research in Asynchronous Circuits and Systems\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"36\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings Second International Symposium on Advanced Research in Asynchronous Circuits and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASYNC.1996.494449\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Second International Symposium on Advanced Research in Asynchronous Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASYNC.1996.494449","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 36

摘要

确定亚稳态特征是具有挑战性的。设计可靠和可重复的实验和程序需要时间、耐心、细心和知识。本讨论提出了精确确定解析时间常数(/spl tau/)和亚稳态窗口(W)的实用测量技术。还包括在时钟之后的指定时间观察亚稳态故障率的方法。通过将故障率转换为观察到的MTBF(平均故障间隔时间)，与预测的MTBF进行比较。

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Characterizing metastability

Determining metastability characteristics is challenging. Devising reliable and repeatable experiments and procedures requires time, patience, care and knowledge. This discussion presents practical measurement techniques to accurately determine the Resolving Time Constant (/spl tau/) and Metastability Window (W). Also included is a method for observing the metastability failure rate at a designated time following the clock. By converting this failure rate to observed MTBF (Mean Time Between Failure), a comparison is made to a predicted MTBF.

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Proceedings Second International Symposium on Advanced Research in Asynchronous Circuits and Systems

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