使用基于测量的CDM放电头模型预测产品特定的CDM应力

2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) Pub Date : 2016-09-01 DOI:10.1109/EOSESD.2016.7592542

Friedrich zur Nieden, K. Esmark, Stefan Seidl, R. Gartner

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引用次数: 7

摘要

由于更新了波形要求，CDM联合标准的引入对测试仪硬件的电性能产生了影响。利用频域测量数据生成了不同CDM放电头的模型。根据不同的标准对器件的放电电流进行时域模拟。与流行但被取代的JEDEC标准相比，峰值电流水平有所增加。

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Predict the product specific CDM stress using measurement-based models of CDM discharge heads

The introduction of the CDM Joint Standard has an impact on the electrical properties of the tester hardware due to updated waveform requirements. Models of different CDM discharge heads are generated using measurement data in frequency domain. Discharge currents of a device are simulated according to the different standards in time domain. In comparison to the popular but replaced JEDEC standard peak current levels have increased.

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来源期刊

2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

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