滤波器设计用于封装在混合信号测试总线上的可测试性

Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) Pub Date : 2002-04-28 DOI:10.1109/VTS.2002.1011139

J. Calvano, V. Alves, A. C. M. Filho, M. Lubaszewski

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引用次数: 5

摘要

本文提出了一种基于IEEE 1149.4标准的任意阶连续时间有源滤波器的测试方法设计。该方法依赖于利用部分分式提取合成滤波器传递函数。传递函数是由通过可用的标准基础设施连接的1/sup / order块构建的。在这种方法下，结构测试可以使用简单的测试向量进行，这些测试向量是根据故障模拟过程公开的。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Filters designed for testability wrapped on the Mixed-Signal Test Bus

This work presents a design for test method for continuous time active filters of any order, using the IEEE 1149.4 as its backbone structure. The method relies on the synthesis of filter transfer functions using partial fraction extraction. Transfer functions are built from 1/sup st/ order blocks connected via the available standard infrastructure. Under this approach, structural test can be carried out using simple test vectors, which are disclosed according to a fault simulation process.

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Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)

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