{"title":"m- of-n代码的高效全自检检查器设计","authors":"W.-F. Chang, C.-W. Wu","doi":"10.1109/ATS.1993.398818","DOIUrl":null,"url":null,"abstract":"This paper presents a new design method of efficient totally self-checking (TSC) checkers for m-out-of-n code. The design procedure has three steps. First, we append an appropriate number of 1's to the m/n code to get a k/2k code, and design a TSC checker for this k/2k code which can be easily constructed by the conventional method. Then, we delete the appended 1's and simplify the circuit to get an m/n code checker. Finally, we modify the checker using super gates to meet the self-testing conditions ad get a final TSC m/n code checker. Compared with previous methods, our TSC checker requires significantly less hardware.<<ETX>>","PeriodicalId":228291,"journal":{"name":"Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS)","volume":"179 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Design of efficient totally self-checking checkers for m-out-of-n code\",\"authors\":\"W.-F. Chang, C.-W. Wu\",\"doi\":\"10.1109/ATS.1993.398818\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a new design method of efficient totally self-checking (TSC) checkers for m-out-of-n code. The design procedure has three steps. First, we append an appropriate number of 1's to the m/n code to get a k/2k code, and design a TSC checker for this k/2k code which can be easily constructed by the conventional method. Then, we delete the appended 1's and simplify the circuit to get an m/n code checker. Finally, we modify the checker using super gates to meet the self-testing conditions ad get a final TSC m/n code checker. Compared with previous methods, our TSC checker requires significantly less hardware.<<ETX>>\",\"PeriodicalId\":228291,\"journal\":{\"name\":\"Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS)\",\"volume\":\"179 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-11-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1993.398818\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1993.398818","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design of efficient totally self-checking checkers for m-out-of-n code
This paper presents a new design method of efficient totally self-checking (TSC) checkers for m-out-of-n code. The design procedure has three steps. First, we append an appropriate number of 1's to the m/n code to get a k/2k code, and design a TSC checker for this k/2k code which can be easily constructed by the conventional method. Then, we delete the appended 1's and simplify the circuit to get an m/n code checker. Finally, we modify the checker using super gates to meet the self-testing conditions ad get a final TSC m/n code checker. Compared with previous methods, our TSC checker requires significantly less hardware.<>