强化RISC微控制器的总剂量和重离子评估

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Pub Date : 1999-09-13 DOI:10.1109/RADECS.1999.858639

E. Feuilloley, D. Hamonic, S. Cayron, E. Dubocquet, P. Jeannin, F. Bezerra

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引用次数: 0

摘要

本文利用IEEE 1149.1 (JTAG)标准的综合测试资源，提出了一种评估总剂量和重离子反应的方法。采用霍尼韦尔SSEC SOI RICMOS/sup TM/ IV技术制造的FLAME微控制器(与SPARC/sup TM/ V8架构兼容)用于验证该方法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Total dose and heavy ion evaluation of a hardened RISC microcontroller

This paper presents an evaluation methodology of the total dose and heavy ion response based on utilising the integrated test resources of the IEEE 1149.1 (JTAG) standard. The FLAME microcontroller (compatible with the SPARC/sup TM/ V8 architecture), fabricated in the Honeywell SSEC SOI RICMOS/sup TM/ IV technology, is used to validate the method.

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来源期刊

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)

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