{"title":"翻转镜像旋转:非易失性存储器中减少比特写入和损耗均衡的体系结构","authors":"Poovaiah M. Palangappa, K. Mohanram","doi":"10.1145/2742060.2742110","DOIUrl":null,"url":null,"abstract":"This paper proposes Flip-Mirror-Rotate (FMR), an architecture for bit-write reduction and endurance enhancement in emerging non-volatile memories (NVMs). FMR comprises three components: adaptive Flip-N-Write (aFNW), Mirror-N-Write (MNW), and Rotate-N-Write (RNW). aFNW and MNW focus on word-level bit-write reduction, which reduces NVM dynamic energy while also improving endurance. RNW is an intra-word wear leveling scheme that operates at cache line granularity. The proposed FMR architecture is integrated with frequent pattern compression (FPC) to simultaneously reduce bit-writes and wear in NVMs. Trace-based simulations of the SPEC CPU2006 benchmarks show that for the same memory overhead and < 1% loss in memory bandwidth, FMR reduces bit-writes (dynamic energy) by 48% (29%) in comparison to classical read-modify-write (DCW), 39% (13%) in comparison to Flip-N-Write (FNW), and 21% (14%) in comparison to FPC. Simultaneously, FMR also reduces the peak bit-writes per cell by 47% in comparison to DCW, 34% in comparison to FNW, and 47% in comparison to FPC, improving NVM endurance.","PeriodicalId":255133,"journal":{"name":"Proceedings of the 25th edition on Great Lakes Symposium on VLSI","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"32","resultStr":"{\"title\":\"Flip-Mirror-Rotate: An Architecture for Bit-write Reduction and Wear Leveling in Non-volatile Memories\",\"authors\":\"Poovaiah M. Palangappa, K. Mohanram\",\"doi\":\"10.1145/2742060.2742110\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper proposes Flip-Mirror-Rotate (FMR), an architecture for bit-write reduction and endurance enhancement in emerging non-volatile memories (NVMs). FMR comprises three components: adaptive Flip-N-Write (aFNW), Mirror-N-Write (MNW), and Rotate-N-Write (RNW). aFNW and MNW focus on word-level bit-write reduction, which reduces NVM dynamic energy while also improving endurance. RNW is an intra-word wear leveling scheme that operates at cache line granularity. The proposed FMR architecture is integrated with frequent pattern compression (FPC) to simultaneously reduce bit-writes and wear in NVMs. Trace-based simulations of the SPEC CPU2006 benchmarks show that for the same memory overhead and < 1% loss in memory bandwidth, FMR reduces bit-writes (dynamic energy) by 48% (29%) in comparison to classical read-modify-write (DCW), 39% (13%) in comparison to Flip-N-Write (FNW), and 21% (14%) in comparison to FPC. Simultaneously, FMR also reduces the peak bit-writes per cell by 47% in comparison to DCW, 34% in comparison to FNW, and 47% in comparison to FPC, improving NVM endurance.\",\"PeriodicalId\":255133,\"journal\":{\"name\":\"Proceedings of the 25th edition on Great Lakes Symposium on VLSI\",\"volume\":\"35 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-05-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"32\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 25th edition on Great Lakes Symposium on VLSI\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/2742060.2742110\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 25th edition on Great Lakes Symposium on VLSI","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2742060.2742110","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 32
摘要
本文提出了一种用于减少新兴非易失性存储器(nvm)的比特写入和增强持久性的结构——翻转镜像旋转(FMR)。FMR由三个部分组成:自适应翻转- n -写(aFNW)、镜像- n -写(MNW)和旋转- n -写(RNW)。aFNW和MNW侧重于字级比特写减少,这降低了NVM的动态能量,同时也提高了耐用性。RNW是一种按缓存线粒度操作的字内损耗均衡方案。提出的FMR架构与频繁模式压缩(FPC)相结合,可以同时减少nvm中的比特写入和损耗。基于跟踪的SPEC CPU2006基准测试模拟表明,对于相同的内存开销和< 1%的内存带宽损失,FMR与传统的读-修改-写(DCW)相比减少了48%(29%)的写位(动态能量),与翻转- n -写(FNW)相比减少了39%(13%),与FPC相比减少了21%(14%)。同时,与DCW相比,FMR还将每个单元的峰值比特写入减少了47%,与FNW相比减少了34%,与FPC相比减少了47%,从而提高了NVM的耐用性。
Flip-Mirror-Rotate: An Architecture for Bit-write Reduction and Wear Leveling in Non-volatile Memories
This paper proposes Flip-Mirror-Rotate (FMR), an architecture for bit-write reduction and endurance enhancement in emerging non-volatile memories (NVMs). FMR comprises three components: adaptive Flip-N-Write (aFNW), Mirror-N-Write (MNW), and Rotate-N-Write (RNW). aFNW and MNW focus on word-level bit-write reduction, which reduces NVM dynamic energy while also improving endurance. RNW is an intra-word wear leveling scheme that operates at cache line granularity. The proposed FMR architecture is integrated with frequent pattern compression (FPC) to simultaneously reduce bit-writes and wear in NVMs. Trace-based simulations of the SPEC CPU2006 benchmarks show that for the same memory overhead and < 1% loss in memory bandwidth, FMR reduces bit-writes (dynamic energy) by 48% (29%) in comparison to classical read-modify-write (DCW), 39% (13%) in comparison to Flip-N-Write (FNW), and 21% (14%) in comparison to FPC. Simultaneously, FMR also reduces the peak bit-writes per cell by 47% in comparison to DCW, 34% in comparison to FNW, and 47% in comparison to FPC, improving NVM endurance.