P. Magarshack
{"title":"为纳米技术构建系统级芯片","authors":"P. Magarshack","doi":"10.1109/VTEST.2003.1197624","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":292996,"journal":{"name":"Proceedings. 21st VLSI Test Symposium, 2003.","volume":"530 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-05-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Building yield into systems-on chips for nanometer technologies\",\"authors\":\"P. Magarshack\",\"doi\":\"10.1109/VTEST.2003.1197624\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":292996,\"journal\":{\"name\":\"Proceedings. 21st VLSI Test Symposium, 2003.\",\"volume\":\"530 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-05-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings. 21st VLSI Test Symposium, 2003.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTEST.2003.1197624\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. 21st VLSI Test Symposium, 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.2003.1197624","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0