基于5 kV HBM变压器的ESD保护5-6 GHz LNA

J. Borremans, S. Thijs, P. Wambacq, D. Linten, Yves Rolain, Maarten Kuijk
{"title":"基于5 kV HBM变压器的ESD保护5-6 GHz LNA","authors":"J. Borremans, S. Thijs, P. Wambacq, D. Linten, Yves Rolain, Maarten Kuijk","doi":"10.1109/VLSIC.2007.4342677","DOIUrl":null,"url":null,"abstract":"Integrated designs in deep-submicron CMOS require ESD protection for their I/O pins. Since CMOS scaling drastically lowers the breakdown voltage of a MOS transistor, the available design window for ESD protection is narrowing. An inductor-based ESD protection offers superb protection but is severely area consuming. In this paper we propose a transformer-based ESD protection for inductor-based LNAs. We demonstrate that the proposed technique offers excellent ESD protection and RF performance without the loss of area.","PeriodicalId":261092,"journal":{"name":"2007 IEEE Symposium on VLSI Circuits","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-06-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":"{\"title\":\"A 5 kV HBM transformer-based ESD protected 5-6 GHz LNA\",\"authors\":\"J. Borremans, S. Thijs, P. Wambacq, D. Linten, Yves Rolain, Maarten Kuijk\",\"doi\":\"10.1109/VLSIC.2007.4342677\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Integrated designs in deep-submicron CMOS require ESD protection for their I/O pins. Since CMOS scaling drastically lowers the breakdown voltage of a MOS transistor, the available design window for ESD protection is narrowing. An inductor-based ESD protection offers superb protection but is severely area consuming. In this paper we propose a transformer-based ESD protection for inductor-based LNAs. We demonstrate that the proposed technique offers excellent ESD protection and RF performance without the loss of area.\",\"PeriodicalId\":261092,\"journal\":{\"name\":\"2007 IEEE Symposium on VLSI Circuits\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-06-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"13\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE Symposium on VLSI Circuits\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIC.2007.4342677\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Symposium on VLSI Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.2007.4342677","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13

摘要

深亚微米CMOS的集成设计需要对其I/O引脚进行ESD保护。由于CMOS缩放大大降低了MOS晶体管的击穿电压,因此ESD保护的可用设计窗口正在缩小。基于电感的ESD保护提供了极好的保护,但严重消耗面积。本文提出了一种基于变压器的电感式lna ESD保护方案。我们证明了所提出的技术提供了出色的ESD保护和射频性能,而没有面积损失。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A 5 kV HBM transformer-based ESD protected 5-6 GHz LNA
Integrated designs in deep-submicron CMOS require ESD protection for their I/O pins. Since CMOS scaling drastically lowers the breakdown voltage of a MOS transistor, the available design window for ESD protection is narrowing. An inductor-based ESD protection offers superb protection but is severely area consuming. In this paper we propose a transformer-based ESD protection for inductor-based LNAs. We demonstrate that the proposed technique offers excellent ESD protection and RF performance without the loss of area.
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