{"title":"硅太阳能电池辐射诱发位移损伤的建模:Frenkel缺陷","authors":"T. Maiti, C. Maiti","doi":"10.1109/IPFA.2009.5232562","DOIUrl":null,"url":null,"abstract":"Displacement damage mechanisms due to radiation have been investigated and interpreted via abinitio calculation. Effect of radiation-induced Frenkel defect has been incorporated in device modeling. Current voltage characteristics are studied to establish beginning of life (BOL) parameters of the solar cells and the changes that occur due to irradiation (EOL).","PeriodicalId":210619,"journal":{"name":"2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Modeling of radiation-induced displacement damage in silicon solar cells: Frenkel defect\",\"authors\":\"T. Maiti, C. Maiti\",\"doi\":\"10.1109/IPFA.2009.5232562\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Displacement damage mechanisms due to radiation have been investigated and interpreted via abinitio calculation. Effect of radiation-induced Frenkel defect has been incorporated in device modeling. Current voltage characteristics are studied to establish beginning of life (BOL) parameters of the solar cells and the changes that occur due to irradiation (EOL).\",\"PeriodicalId\":210619,\"journal\":{\"name\":\"2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-07-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IPFA.2009.5232562\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA.2009.5232562","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Modeling of radiation-induced displacement damage in silicon solar cells: Frenkel defect
Displacement damage mechanisms due to radiation have been investigated and interpreted via abinitio calculation. Effect of radiation-induced Frenkel defect has been incorporated in device modeling. Current voltage characteristics are studied to establish beginning of life (BOL) parameters of the solar cells and the changes that occur due to irradiation (EOL).