{"title":"对称厚膜EMI/RFI滤波器","authors":"V. Desnica, L. Zivanov, O. Aleksic, M. Lukovic","doi":"10.1109/MIEL.2002.1003211","DOIUrl":null,"url":null,"abstract":"Thick film technology using a well-known concept is presented as a workable approach for integration of passive components. This work states seventeen (17) different symmetrical EMI/RFI (electromagnetic interference/radio frequency interference) filter designs. Attenuation and Smith charts of symmetrical EMI/RFI filters are measured on network analyzer in the range of 1MHz to 3 GHz.","PeriodicalId":221518,"journal":{"name":"2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595)","volume":"86 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Symmetrical thick film EMI/RFI filters\",\"authors\":\"V. Desnica, L. Zivanov, O. Aleksic, M. Lukovic\",\"doi\":\"10.1109/MIEL.2002.1003211\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Thick film technology using a well-known concept is presented as a workable approach for integration of passive components. This work states seventeen (17) different symmetrical EMI/RFI (electromagnetic interference/radio frequency interference) filter designs. Attenuation and Smith charts of symmetrical EMI/RFI filters are measured on network analyzer in the range of 1MHz to 3 GHz.\",\"PeriodicalId\":221518,\"journal\":{\"name\":\"2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595)\",\"volume\":\"86 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-08-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MIEL.2002.1003211\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MIEL.2002.1003211","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Thick film technology using a well-known concept is presented as a workable approach for integration of passive components. This work states seventeen (17) different symmetrical EMI/RFI (electromagnetic interference/radio frequency interference) filter designs. Attenuation and Smith charts of symmetrical EMI/RFI filters are measured on network analyzer in the range of 1MHz to 3 GHz.