静态CMOS电路的故障诊断

Proceedings Sixth Asian Test Symposium (ATS'97) Pub Date : 1997-11-17 DOI:10.1109/ATS.1997.643971

W. Xiaoqing, H. Tamamoto, K. Saluja, K. Kinoshita

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引用次数: 8

摘要

本文提出了一种利用I/sub DDQ/和逻辑信息进行晶体管漏电故障诊断的新方法。提出了一种故障仿真中中间故障电压的处理方法。提出了一种基于中间故障电压的逻辑信息生成诊断测试向量的方案。最后用一个实例说明了新的诊断方法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Fault diagnosis for static CMOS circuits

This paper presents a new methodology for transistor leakage fault diagnosis using both I/sub DDQ/ and logic information. A method for handling intermediate faulty voltages in fault simulation is proposed. A scheme for generating diagnostic test vectors based on logic information in the presence of intermediate faulty voltages is also proposed. An example is used to demonstrate the new diagnosis methodology.

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Proceedings Sixth Asian Test Symposium (ATS'97)

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