实用动态激光刺激技术与代码修改:微控制器自检故障的软缺陷定位方法

2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) Pub Date : 2019-07-01 DOI:10.1109/IPFA47161.2019.8984852

Kevin Joshua S. Cala, Junald C. Saludares, Wendel A. Basbas

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引用次数: 0

摘要

提出了一种针对动态故障进行软缺陷定位和故障隔离的实用方法。该方法利用现有的光束诱导电阻变化(OBIRCH)硬件，无需动态激光刺激(DLS)附加套件，再加上涉及代码修改的详尽的电样品准备步骤。事实证明，该技术在定位与电阻互连有关的故障方面是有效的，而使用传统的静态技术很难分析电阻互连。

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Practical Dynamic Laser Stimulation Technique and Code Modification: A Soft Defect Localization Approach for Microcontroller Self-Test Failures

A practical alternative for soft defect localization (SDL) and fault isolation of dynamic failures is presented. The approach utilizes an existing optical beam induced resistance change (OBIRCH) hardware without a dynamic laser stimulation (DLS) add-on kit, coupled with an exhaustive electrical sample prep step which involves code modification. The technique was proven effective in localizing failures pertaining to resistive interconnects which are rather difficult to analyze using conventional static techniques.

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来源期刊

2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA)

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