植物化石遗骸的FIB分析:技术和实验方面

A. Benedetti, L. M. Sender, I. Escapa, R. Cúneo, J. Díez
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引用次数: 1

摘要

本文对聚焦离子束(FIB)在化石叶片角质层和压缩研究中的技术应用进行了全面的研究。该技术使我们能够以10纳米范围内的空间分辨率对化石联合植物遗骸进行横切面和成像,远远高于迄今为止使用的任何其他方法。在铣削过程的各个阶段,我们观察到明显的镓在沟槽壁上的再沉积,特别是在空腔的情况下。通过降低光束电流和加速电压,这些非常不需要的伪像可以大大减少,但不能完全消除;然而,在解释横断面图像时需要非常小心。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
FIB analysis of fossils plant remains: Technical and experimental aspects
We present a comprehensive study about the technical aspects of the application of focused ion beam (FIB) to the study of cuticles and compressions of fossil leaves. The technique allowed us to cross section and image fossil coalified plant remains with a spatial resolution within the 10 nm range, far higher than any other method employed so far. At various stages of the milling process, we observed significant gallium redeposition on the trench walls, particularly pronounced in the case of cavities. These highly unwanted artefacts can be greatly reduced, but not wholly eliminated, by lowering either or both the beam current and acceleration voltage; nevertheless, great care is needed when interpreting cross-sectional images.
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