{"title":"基于动态电热物理的功率器件紧凑模型,用于器件和电路仿真","authors":"P. Igić, P. Mawby, M. Towers, S. Batcup","doi":"10.1109/STHERM.2001.915142","DOIUrl":null,"url":null,"abstract":"New dynamic electro-thermal models of the power MOSFET, and power bipolar devices (PiN diode and IGBT) are presented in this paper. Firstly, electric device models were made, and then they were transformed into the electro-thermal models by adding a thermal node. This thermal node stores information about junction temperature and represents a connection between the device and rest of the circuit thermal network. All models have been found to be efficient and robust in all cases examined.","PeriodicalId":307079,"journal":{"name":"Seventeenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.01CH37189)","volume":"143 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-03-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"31","resultStr":"{\"title\":\"Dynamic electro-thermal physically based compact models of the power devices for device and circuit simulations\",\"authors\":\"P. Igić, P. Mawby, M. Towers, S. Batcup\",\"doi\":\"10.1109/STHERM.2001.915142\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"New dynamic electro-thermal models of the power MOSFET, and power bipolar devices (PiN diode and IGBT) are presented in this paper. Firstly, electric device models were made, and then they were transformed into the electro-thermal models by adding a thermal node. This thermal node stores information about junction temperature and represents a connection between the device and rest of the circuit thermal network. All models have been found to be efficient and robust in all cases examined.\",\"PeriodicalId\":307079,\"journal\":{\"name\":\"Seventeenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.01CH37189)\",\"volume\":\"143 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-03-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"31\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Seventeenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.01CH37189)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/STHERM.2001.915142\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Seventeenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.01CH37189)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/STHERM.2001.915142","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Dynamic electro-thermal physically based compact models of the power devices for device and circuit simulations
New dynamic electro-thermal models of the power MOSFET, and power bipolar devices (PiN diode and IGBT) are presented in this paper. Firstly, electric device models were made, and then they were transformed into the electro-thermal models by adding a thermal node. This thermal node stores information about junction temperature and represents a connection between the device and rest of the circuit thermal network. All models have been found to be efficient and robust in all cases examined.