智能功率集成电路中衬底电流的建模

J. Oehmen, M. Olbrich, E. Barke
{"title":"智能功率集成电路中衬底电流的建模","authors":"J. Oehmen, M. Olbrich, E. Barke","doi":"10.1109/ISPSD.2005.1487967","DOIUrl":null,"url":null,"abstract":"Switchings of power stages in smart power ICs, which drive an inductive load, turns on parasitic bipolar transistors and inject minority carriers into the substrate, which can affect the functionality of the chip. We present a parasitic transistor model for post layout simulation, which accounts for a strongly in homogeneous current flow, a base width of up to a few hundred /spl mu/m, multiple base contacts and collectors, and whose parameters are easily extractable from layout and technology data.","PeriodicalId":154808,"journal":{"name":"Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005.","volume":"280 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Modeling substrate currents in smart power ICs\",\"authors\":\"J. Oehmen, M. Olbrich, E. Barke\",\"doi\":\"10.1109/ISPSD.2005.1487967\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Switchings of power stages in smart power ICs, which drive an inductive load, turns on parasitic bipolar transistors and inject minority carriers into the substrate, which can affect the functionality of the chip. We present a parasitic transistor model for post layout simulation, which accounts for a strongly in homogeneous current flow, a base width of up to a few hundred /spl mu/m, multiple base contacts and collectors, and whose parameters are easily extractable from layout and technology data.\",\"PeriodicalId\":154808,\"journal\":{\"name\":\"Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005.\",\"volume\":\"280 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-05-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISPSD.2005.1487967\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.2005.1487967","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

在智能功率集成电路中,驱动感性负载的功率级开关会开启寄生双极晶体管并将少数载流子注入衬底,从而影响芯片的功能。我们提出了一种用于布局后仿真的寄生晶体管模型,该模型考虑了强均匀电流,基极宽度高达几百/spl mu/m,多个基极触点和集电极,其参数易于从布局和技术数据中提取。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Modeling substrate currents in smart power ICs
Switchings of power stages in smart power ICs, which drive an inductive load, turns on parasitic bipolar transistors and inject minority carriers into the substrate, which can affect the functionality of the chip. We present a parasitic transistor model for post layout simulation, which accounts for a strongly in homogeneous current flow, a base width of up to a few hundred /spl mu/m, multiple base contacts and collectors, and whose parameters are easily extractable from layout and technology data.
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