D. Caspary, S. Jähne, P. Nesládek, M. Kristlib, L. Bahrig, A. Feicke, M. Kaiser, J. Lorbeer, T. Wandel
{"title":"电化学效应造成的半圆铬损失","authors":"D. Caspary, S. Jähne, P. Nesládek, M. Kristlib, L. Bahrig, A. Feicke, M. Kaiser, J. Lorbeer, T. Wandel","doi":"10.1117/12.2279699","DOIUrl":null,"url":null,"abstract":"For certain designs, we observe a rather peculiar defect during phase-shift mask production. At distinct positions on the mask, the chrome disappears within the second level process in almost perfect half circles. This effect can even be observed if no etching is applied at all. The root cause of this defect is electrochemical dissolving of chrome in DI water during the development rinse process, which appears at locations where the chrome is in contact to the developer rinse medium. In this publication we describe the experimental set-up to investigate the root cause mechanism and propose solutions to overcome the effect.","PeriodicalId":287066,"journal":{"name":"European Mask and Lithography Conference","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-09-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Half circle chrome loss by electrochemical effects\",\"authors\":\"D. Caspary, S. Jähne, P. Nesládek, M. Kristlib, L. Bahrig, A. Feicke, M. Kaiser, J. Lorbeer, T. Wandel\",\"doi\":\"10.1117/12.2279699\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"For certain designs, we observe a rather peculiar defect during phase-shift mask production. At distinct positions on the mask, the chrome disappears within the second level process in almost perfect half circles. This effect can even be observed if no etching is applied at all. The root cause of this defect is electrochemical dissolving of chrome in DI water during the development rinse process, which appears at locations where the chrome is in contact to the developer rinse medium. In this publication we describe the experimental set-up to investigate the root cause mechanism and propose solutions to overcome the effect.\",\"PeriodicalId\":287066,\"journal\":{\"name\":\"European Mask and Lithography Conference\",\"volume\":\"45 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-09-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"European Mask and Lithography Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.2279699\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"European Mask and Lithography Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2279699","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Half circle chrome loss by electrochemical effects
For certain designs, we observe a rather peculiar defect during phase-shift mask production. At distinct positions on the mask, the chrome disappears within the second level process in almost perfect half circles. This effect can even be observed if no etching is applied at all. The root cause of this defect is electrochemical dissolving of chrome in DI water during the development rinse process, which appears at locations where the chrome is in contact to the developer rinse medium. In this publication we describe the experimental set-up to investigate the root cause mechanism and propose solutions to overcome the effect.