D. Alexander, Alonzo Vera, James Aarestad, Gabriel V. Urbaitis
{"title":"高级混合信号ADC/DAC微电路的总剂量测试","authors":"D. Alexander, Alonzo Vera, James Aarestad, Gabriel V. Urbaitis","doi":"10.1109/NSREC.2017.8115443","DOIUrl":null,"url":null,"abstract":"Total dose test results are presented for the Maxim 1257/1258 multi-channel ADC/DAC, and the Linear Technology LTC2378-20 low power SAR ADC. The paper discusses radiation testing challenges of complex mixed signal circuits.","PeriodicalId":284506,"journal":{"name":"2017 IEEE Radiation Effects Data Workshop (REDW)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Total dose testing of advanced mixed signal ADC/DAC microcircuits\",\"authors\":\"D. Alexander, Alonzo Vera, James Aarestad, Gabriel V. Urbaitis\",\"doi\":\"10.1109/NSREC.2017.8115443\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Total dose test results are presented for the Maxim 1257/1258 multi-channel ADC/DAC, and the Linear Technology LTC2378-20 low power SAR ADC. The paper discusses radiation testing challenges of complex mixed signal circuits.\",\"PeriodicalId\":284506,\"journal\":{\"name\":\"2017 IEEE Radiation Effects Data Workshop (REDW)\",\"volume\":\"16 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE Radiation Effects Data Workshop (REDW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NSREC.2017.8115443\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE Radiation Effects Data Workshop (REDW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSREC.2017.8115443","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Total dose testing of advanced mixed signal ADC/DAC microcircuits
Total dose test results are presented for the Maxim 1257/1258 multi-channel ADC/DAC, and the Linear Technology LTC2378-20 low power SAR ADC. The paper discusses radiation testing challenges of complex mixed signal circuits.
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