纳米级芯片上密码系统(CoC)的泄漏功率与侧信道安全性

Amir Khatib Zadeh, C. Gebotys
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引用次数: 2

摘要

本文研究了使用泄漏功耗作为侧信道信息来源的可行性。侧通道效应表现为泄漏功率。结果表明,泄漏功率的增加趋势与密码系统的安全漏洞高度相关。为了解决纳米级芯片上密码系统(CoC)中侧信道威胁的严重性,我们研究了侧信道安全应用的泄漏减少技术。结果表明,在基于电路的减少技术中,高v晶体管分配可以显著降低泄漏功率的平均和标准差,可以作为亚微米时代CoC设计和实现的侧通道感知泄漏减少技术。本文首次提出的研究结果对于未来CMOS技术中抗侧信道密码系统的开发至关重要。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Leakage Power and Side Channel Security of Nanoscale Cryptosystem-on-Chip (CoC)
This paper investigates the viability of using leakage power consumption as a source of side channel information. The side channel effect is characterized in leakage power. It is shown that the increasing trend of leakage power is highly correlated with security vulnerability of cryptosystems. Addressing the severity of the side channel threat in nanoscale Cryptosystem-on-Chip (CoC), we examine the leakage reduction techniques for the side channel security application. The result shows among the circuit-based reduction techniques high Vth transistor assignment which significantly reduces both average and standard deviation of the leakage power can be exploited as a side channel aware leakage reduction in design and implementation of CoC in submicron era. The findings in this work which are presented for the first time are crucial for the development of side channel resistant cryptosystems in the upcoming CMOS technologies.
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