Runtime leakage power estimation technique for combinational circuits

This paper carefully examines subthreshold leakage during circuit operation (runtime) and develops a novel analysis technique to capture this important effect, which is currently ignored in traditional steady-state leakage calculation approaches. We implement novel dynamic and static estimation methods that provide significant speed improvements over full SPICE simulations and yield estimation errors of approximately 12% on average compared to more than 2times errors in steady-state based subthreshold leakage analysis.