{"title":"CMOS共面螺旋电感的串扰耦合效应","authors":"J. Mikkelsen, O. K. Jensen, T. Larsen","doi":"10.1109/CICC.2004.1358825","DOIUrl":null,"url":null,"abstract":"The coupling effects between two adjacent co-planar spiral inductors are characterized in two cases, one where no guard structure is used and one where simple guard-rings are used. In addition, the effect of guard-rings is evaluated at different distances (190 /spl mu/m to 1090 /spl mu/m) between inductors. The model traditionally used to predict this crosstalk is found to be insufficient and an extended model including mutual inductive coupling and direct capacitive coupling is shown to provide accurate fit. Measuring low levels of crosstalk is difficult and in this context the effect of the test fixture itself is evaluated. Return current paths are here found to have significant influence on low frequency results. Also, based on laser cutting of test fixtures, a surrounding ground-ring is found to increase the crosstalk level. The use of simple guard-rings is shown to improve isolation by approximately 10-15 dB for closely spaced adjacent inductors. At larger distances the gain from having a guard-ring reduces and eventually reduces to zero at a distance of 1000 /spl mu/m. For closely spaced devices a doubling of distance is found to provide an additional 20 dB attenuation of crosstalk.","PeriodicalId":407909,"journal":{"name":"Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-11-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"19","resultStr":"{\"title\":\"Crosstalk coupling effects of CMOS co-planar spiral inductors\",\"authors\":\"J. Mikkelsen, O. K. Jensen, T. Larsen\",\"doi\":\"10.1109/CICC.2004.1358825\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The coupling effects between two adjacent co-planar spiral inductors are characterized in two cases, one where no guard structure is used and one where simple guard-rings are used. In addition, the effect of guard-rings is evaluated at different distances (190 /spl mu/m to 1090 /spl mu/m) between inductors. The model traditionally used to predict this crosstalk is found to be insufficient and an extended model including mutual inductive coupling and direct capacitive coupling is shown to provide accurate fit. Measuring low levels of crosstalk is difficult and in this context the effect of the test fixture itself is evaluated. Return current paths are here found to have significant influence on low frequency results. Also, based on laser cutting of test fixtures, a surrounding ground-ring is found to increase the crosstalk level. The use of simple guard-rings is shown to improve isolation by approximately 10-15 dB for closely spaced adjacent inductors. At larger distances the gain from having a guard-ring reduces and eventually reduces to zero at a distance of 1000 /spl mu/m. For closely spaced devices a doubling of distance is found to provide an additional 20 dB attenuation of crosstalk.\",\"PeriodicalId\":407909,\"journal\":{\"name\":\"Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-11-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"19\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CICC.2004.1358825\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.2004.1358825","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Crosstalk coupling effects of CMOS co-planar spiral inductors
The coupling effects between two adjacent co-planar spiral inductors are characterized in two cases, one where no guard structure is used and one where simple guard-rings are used. In addition, the effect of guard-rings is evaluated at different distances (190 /spl mu/m to 1090 /spl mu/m) between inductors. The model traditionally used to predict this crosstalk is found to be insufficient and an extended model including mutual inductive coupling and direct capacitive coupling is shown to provide accurate fit. Measuring low levels of crosstalk is difficult and in this context the effect of the test fixture itself is evaluated. Return current paths are here found to have significant influence on low frequency results. Also, based on laser cutting of test fixtures, a surrounding ground-ring is found to increase the crosstalk level. The use of simple guard-rings is shown to improve isolation by approximately 10-15 dB for closely spaced adjacent inductors. At larger distances the gain from having a guard-ring reduces and eventually reduces to zero at a distance of 1000 /spl mu/m. For closely spaced devices a doubling of distance is found to provide an additional 20 dB attenuation of crosstalk.