G. Micolau, K. Castellani-Coulié, H. Aziza, J. Portal
{"title":"SITARe:用于分析和诊断辐射效应的模拟工具","authors":"G. Micolau, K. Castellani-Coulié, H. Aziza, J. Portal","doi":"10.1109/LATW.2012.6261254","DOIUrl":null,"url":null,"abstract":"This work provides reliability criteria to detect and diagnose multi-events upset by the use of a SER tool. The study is based on a charge generation model used to simulate the impact of an ionizing particle striking the sensitive nodes of a SRAM cell. The currents, collected at the sensitive nodes are generated by the physical model and injected at circuit level. Thus, a correlation between the circuit electrical behavior and injected currents is established to provide a reliability criterion.","PeriodicalId":173735,"journal":{"name":"2012 13th Latin American Test Workshop (LATW)","volume":"295 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-04-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"SITARe: A simulation tool for analysis and diagnosis of radiation effects\",\"authors\":\"G. Micolau, K. Castellani-Coulié, H. Aziza, J. Portal\",\"doi\":\"10.1109/LATW.2012.6261254\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work provides reliability criteria to detect and diagnose multi-events upset by the use of a SER tool. The study is based on a charge generation model used to simulate the impact of an ionizing particle striking the sensitive nodes of a SRAM cell. The currents, collected at the sensitive nodes are generated by the physical model and injected at circuit level. Thus, a correlation between the circuit electrical behavior and injected currents is established to provide a reliability criterion.\",\"PeriodicalId\":173735,\"journal\":{\"name\":\"2012 13th Latin American Test Workshop (LATW)\",\"volume\":\"295 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-04-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 13th Latin American Test Workshop (LATW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/LATW.2012.6261254\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 13th Latin American Test Workshop (LATW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LATW.2012.6261254","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
SITARe: A simulation tool for analysis and diagnosis of radiation effects
This work provides reliability criteria to detect and diagnose multi-events upset by the use of a SER tool. The study is based on a charge generation model used to simulate the impact of an ionizing particle striking the sensitive nodes of a SRAM cell. The currents, collected at the sensitive nodes are generated by the physical model and injected at circuit level. Thus, a correlation between the circuit electrical behavior and injected currents is established to provide a reliability criterion.