S. Ryu, Lin Cheng, S. Dhar, C. Capell, C. Jonas, R. Callanan, A. Agarwal, J. Palmour, A. Lelis, C. Scozzie, B. Geil
{"title":"3.7 mΩ-cm2, 1500 V 4H-SiC dmosfet,用于先进的高功率,高频应用","authors":"S. Ryu, Lin Cheng, S. Dhar, C. Capell, C. Jonas, R. Callanan, A. Agarwal, J. Palmour, A. Lelis, C. Scozzie, B. Geil","doi":"10.1109/ISPSD.2011.5890832","DOIUrl":null,"url":null,"abstract":"We present our most recent developments in 4H-SiC DMOSFETs. A 4H-SiC DMOSFET with an active area of 0.1 cm2 showed a specific on-resistance of 3.7 mΩ-cm2 with a gate bias of 20 V, and an avalanche voltage of 1500 V with gate shorted to source at 25°C. A threshold voltage of 3.5 V was extracted from the DMOSFET, and a subthreshold swing of 200 mV/dec was measured. The device was successfully scaled to an active area of 0.5 cm2, and the resulting device showed a drain current of 377 A at a forward voltage drop of 3.8 V at 25°C.","PeriodicalId":132504,"journal":{"name":"2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":"{\"title\":\"3.7 mΩ-cm2, 1500 V 4H-SiC DMOSFETs for advanced high power, high frequency applications\",\"authors\":\"S. Ryu, Lin Cheng, S. Dhar, C. Capell, C. Jonas, R. Callanan, A. Agarwal, J. Palmour, A. Lelis, C. Scozzie, B. Geil\",\"doi\":\"10.1109/ISPSD.2011.5890832\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present our most recent developments in 4H-SiC DMOSFETs. A 4H-SiC DMOSFET with an active area of 0.1 cm2 showed a specific on-resistance of 3.7 mΩ-cm2 with a gate bias of 20 V, and an avalanche voltage of 1500 V with gate shorted to source at 25°C. A threshold voltage of 3.5 V was extracted from the DMOSFET, and a subthreshold swing of 200 mV/dec was measured. The device was successfully scaled to an active area of 0.5 cm2, and the resulting device showed a drain current of 377 A at a forward voltage drop of 3.8 V at 25°C.\",\"PeriodicalId\":132504,\"journal\":{\"name\":\"2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-05-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"21\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISPSD.2011.5890832\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.2011.5890832","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
3.7 mΩ-cm2, 1500 V 4H-SiC DMOSFETs for advanced high power, high frequency applications
We present our most recent developments in 4H-SiC DMOSFETs. A 4H-SiC DMOSFET with an active area of 0.1 cm2 showed a specific on-resistance of 3.7 mΩ-cm2 with a gate bias of 20 V, and an avalanche voltage of 1500 V with gate shorted to source at 25°C. A threshold voltage of 3.5 V was extracted from the DMOSFET, and a subthreshold swing of 200 mV/dec was measured. The device was successfully scaled to an active area of 0.5 cm2, and the resulting device showed a drain current of 377 A at a forward voltage drop of 3.8 V at 25°C.