用于射频电路仿真的SOI FinFET紧凑模型

J. Alvarado, J. Tinoco, S. Salas, A. G. Martinez-Lopez, B. Soto-Cruz, A. Cerdeira, J. Raskin
{"title":"用于射频电路仿真的SOI FinFET紧凑模型","authors":"J. Alvarado, J. Tinoco, S. Salas, A. G. Martinez-Lopez, B. Soto-Cruz, A. Cerdeira, J. Raskin","doi":"10.1109/SIRF.2013.6489441","DOIUrl":null,"url":null,"abstract":"A methodology to properly establish an accurate SOI FinFET compact model through SPICE simulator is presented. This compact model is implemented in Verilog-A to simulate the performance of RF circuits based on SOI FinFET technology. It predicts well static behavior of the transistor and circuit, as well as their small-signal RF behavior by modeling the intrinsic capacitances and also the effects of the gate resistance and the extrinsic gate capacitances. Finally, the comparison between the simulated and measured performance of a Low Noise Amplifier demonstrates the validity and the capabilities of this compact model to simulate the dc and RF behavior of RF circuits.","PeriodicalId":286070,"journal":{"name":"2013 IEEE 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-03-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"SOI FinFET compact model for RF circuits simulation\",\"authors\":\"J. Alvarado, J. Tinoco, S. Salas, A. G. Martinez-Lopez, B. Soto-Cruz, A. Cerdeira, J. Raskin\",\"doi\":\"10.1109/SIRF.2013.6489441\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A methodology to properly establish an accurate SOI FinFET compact model through SPICE simulator is presented. This compact model is implemented in Verilog-A to simulate the performance of RF circuits based on SOI FinFET technology. It predicts well static behavior of the transistor and circuit, as well as their small-signal RF behavior by modeling the intrinsic capacitances and also the effects of the gate resistance and the extrinsic gate capacitances. Finally, the comparison between the simulated and measured performance of a Low Noise Amplifier demonstrates the validity and the capabilities of this compact model to simulate the dc and RF behavior of RF circuits.\",\"PeriodicalId\":286070,\"journal\":{\"name\":\"2013 IEEE 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-03-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SIRF.2013.6489441\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SIRF.2013.6489441","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16

摘要

提出了一种通过SPICE模拟器正确建立精确SOI FinFET紧凑模型的方法。该紧凑模型在Verilog-A中实现,用于模拟基于SOI FinFET技术的射频电路的性能。它通过模拟晶体管和电路的固有电容以及栅极电阻和外部栅极电容的影响,很好地预测了晶体管和电路的静态行为,以及它们的小信号射频行为。最后,将低噪声放大器的仿真性能与实测性能进行比较,证明了该紧凑模型在模拟射频电路的直流和射频行为方面的有效性和能力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
SOI FinFET compact model for RF circuits simulation
A methodology to properly establish an accurate SOI FinFET compact model through SPICE simulator is presented. This compact model is implemented in Verilog-A to simulate the performance of RF circuits based on SOI FinFET technology. It predicts well static behavior of the transistor and circuit, as well as their small-signal RF behavior by modeling the intrinsic capacitances and also the effects of the gate resistance and the extrinsic gate capacitances. Finally, the comparison between the simulated and measured performance of a Low Noise Amplifier demonstrates the validity and the capabilities of this compact model to simulate the dc and RF behavior of RF circuits.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信